A Scanning Elecron Microscope (SEM) is used to visualize the morphology, the chemical composition and the crystallography of the samples at high resolution. Thanks to  Energy-dispersive X-ray spectroscopy analysis (EDX) it is possible to identify the elements which are present in the sample.

Applications

  • Sample morphology visualization
  • Composition contrast image (using backscattered electrons)
  • Chemical composition analysis through X-Rays generation (EDX)
  • Analysis of optoelectronic behaviour of semiconductors using cathodoluminescence
  • Depletion zones visualization (EBIC)
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ADVANTAGES

Resolution for high magnification (resolution < 5nm)

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High depth of field: more than three hundred times that of optical microscopes

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Chemical composition analysis (EDS)

Topgraphical

visualization

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Visual inspection,
defect visualization

Atomic number

contrast imaging

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Different materials visualization

EDX

Microanalysis

Intraspec Technologies - Nos moyens - Microscopie électronique - analyse spectre EDS

Identification and localization of chemical elements of the sample

Look up for our other techniques

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