All discrete components, such as capacitors, diodes and transistors, can be analysed using our characterization tools.
Custom test plans can be designed and executed to evaluate their reliability. We can analyse failing components to localize and visualize different types of defects and to identify their root causes.
Piezo Actuator
failure
Defect localization using Magnetic Microscopy
Resistance to
thermal constraints
Reliability evaluation of a components batch, using different criteria of temperature, humidity, pressure
Characterizations
Electrical and optical-electrical characterizations of a components batch
See below to find our analysis techniques
