Integrated circuits can emit light when activated. Light EMission MIcroscopy (EMMI) uses this physical phenomenon to precisely localize specific areas in the silicon chip. By comparing differences in the emissions, it is possible to localize die level defects.
In addition, we can localize signal propagation failures by performing temporal analyses of the emitted light (TRE, Time Resolved Emission, TRI, Time Resolved Imaging).

Intraspec Technologies - Nos moyens - Microscopie à émission de lumière - EMMI - AOP

ADVANTAGES

Precise defect localization at die level scale

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Preservation of component functionality

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Information on temporal activity

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Possibility to modify electrical parameters during acquisition

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High spatial resolution(1µm)

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Field of view: 10x10mm

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Large working space (possibility to analyse large boards)

Application:

“Static mode”

Intraspec Technologies - Nos moyens - Microscopie à émission de lumière - Services - EMMI Micro

Short circuit localization, overconsumption, analysis of internal activity of the chip and memory descrambling

Application:

“Dynamic mode”

Intraspec Technologies - Nos moyens - Microscopie à émission de lumière - Services - Tri micro

Transient leakage current localization,
Signal propagation detection,
Analysis of delay between two signals,
Frequency anomaly detection

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