The whole lot of discretes components, such as capacitors, diodes and transistors, can be analysed using our characterization tools.
Custom test plans can be designed and executed to evaluate their reliability. We can analyse failing components to localize and visualize different types of defects and to identify their root causes.
Defect localization using Magnetic Microscopy
Reliability evaluation on a components batch, using different criteria of temperature, humidity, pressure
Electrical and optical-electrical characterizations of a components batch