The whole lot of discretes components, such as capacitors, diodes and transistors, can be analysed using our characterization tools.

Custom test plans can be designed and executed to evaluate their reliability. We can analyse failing components to localize and visualize different types of defects and to identify their root causes.

Intraspec - Nos-technologies - passifs et discrets - présentation image

Piezo Actuator

failure

Intraspec - Nos-technologies - passifs et discrets - défaillance piezo actuateur

Defect localization using Magnetic Microscopy

Resistance to

thermal constraints

Intraspec - Nos-technologies - passifs et discrets - tenue contrainte thermique

Reliability evaluation on a components batch, using different criteria of temperature, humidity, pressure

.

Characterizations

Intraspec - Nos-technologies - passifs et discrets - caracterisation

Electrical and optical-electrical characterizations of a components batch

Pertinent techniques

Saississez votre recherche et appuyez sur "Entrée"