Lock-in Thermography is a non-destructive, contact-less localization technique for short circuits and leakages on electronic components, boards and systems. The use of lock-in detection highly increases the technique sensitivity with respect to static thermography. The infrared camera is synchronized at the same frequency as the defect activation signal. This generates an amplitude image and a phase image which will indicate the position and the nature of the defect.
Can be used on any kind of sample from an integrated circuit to 3D components, as well as PCBs. It can localize different types of defects:
Gate oxide damages
of a short circuit
Short circuit fast localization for medium and high resistances on PCB and passive components.
Temperature measurement on working sample
Heat propagation information on any kind of sample