Lock-in Thermography is a non-destructive, contact-less localization technique for short circuits and leakages on electronic components, boards and systems. The use of lock-in detection highly increases the technique sensitivity with respect to static thermography. The infrared camera is synchronized at the same frequency as the defect activation signal. This generates an amplitude and a phase images which will indicate the position and the nature of the defect.

Intraspec Technologies - Nos moyens - Thermographie synchrone - détection synchrone

ADVANTAGES

Can be used on any kind of sample from an integrated circuit to 3D components, as well as PCBs. It can localize different types of defects:
Short circtuit

·

Current leakages

·

ESD defect

·

Gate oxyde damages

·

Defective transistors

Fast localization

of a short circuit

Intraspec Technologies - Nos moyens - Thermographie synchrone - localisation rapide court circuit

Short circuit fast localization for medium and high resistances on PCB and passive components.

Temperature

measurement

Intraspec Technologies - Nos moyens - Thermographie synchrone - mesure de température

Temperature measurement on working sample

Heat propagation

information

Intraspec Technologies - Nos moyens - Thermographie synchrone - propagation de chaleur

Heat propagation information on any kind of sample

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