Lock-in Thermography is a non-destructive, contact-less localization technique for short circuits and leakages on electronic components, boards and systems. The use of lock-in detection highly increases the technique sensitivity with respect to static thermography. The infrared camera is synchronized at the same frequency as the defect activation signal. This generates an amplitude image and a phase image which will indicate the position and the nature of the defect.

Intraspec Technologies - Nos moyens - Thermographie synchrone - détection synchrone

ADVANTAGES

Can be used on any kind of sample from an integrated circuit to 3D components, as well as PCBs. It can localize different types of defects:
Short circuits

·

Current leakages

·

ESD defects

·

Gate oxide damages

·

Defective transistors

Fast localization

of a short circuit

Intraspec Technologies - Nos moyens - Thermographie synchrone - localisation rapide court circuit

Short circuit fast localization for medium and high resistances on PCB and passive components.

Temperature

measurement

Intraspec Technologies - Nos moyens - Thermographie synchrone - mesure de température

Temperature measurement on working sample

Heat propagation

information

Intraspec Technologies - Nos moyens - Thermographie synchrone - propagation de chaleur

Heat propagation information on any kind of sample

See below to find our other techniques

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