Ionizing radiation can produce in electronic components some perturbations called “Single Event Effects”, or SEE. Using a pulsed laser, it is possible to reproduce the electrical behavior due to this phenomenon by locally injecting electric charges in the active area. The correlation with the laser position can therefore produce a map of the sensitive areas of the silicon die.

Intraspec Technologies - Nos moyens - Sensibilité aux SEE - pres mos schematic 2pl stim

ADVANTAGES

Precise localization of the sensitivity at die level, spatial resolution of 1µm

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Control of electrical parameters during the acquisition

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Maximum field of view: 3mmx3mm

Asynchronous

stimulation

Intraspec Technologies - Nos moyens - Sensibilité aux SEE - Stimulation asynchrone

Latch-up sensitive areas map on an ADC

Synchronous

stimulation

intraspec-nos-moyens-sensibilite-aux-see-stimulation-synchrone

Sensitivity visualization on two different synchronization states

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