MAGMA
EFI

Semiconductor
Failure Analysis Capabilities

Failure Analysis for All Static Defects

Magma features a unique set of sensors and techniques allowing for the detection and localization of all static defects.

Magma can be reliably employed to find the location of opens, shorts, leakages and high resistance opens.
Additionally, the magnetic image can be exploited to produce depth information for 3d fault isolation even for multi-layer devices.

Read on to learn more about Magma’s exciting suite of capabilities.

Shorts
Opens
Leakages
High Resistance Opens
3D Fault Isolation
Specifications

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